4.5 Optical Measurements
This section describes the experimental set-up behind some of the regular optical measurements carried out in the course of this study. These include the optical transmittance measurement of the ITO films and assessment of the absolute responsivities of the optoelectronic devices which were subsequently fabricated.
The transmittance of the ITO films were measured using a double beam Perkin Elmer
spectrophotometer (Model 330). In this system, the source beam from a filament lamp is first
monochromated and then split into two separate coherent beams; a clear glass microscope
cover slide is placed in the path of the first beam while an identical cover slide coated with the
ITO film to be characterised is placed in the path of the second beam. These monochromatic
beams are then converged and converted to a measurable electrical signal. This process is
repeated by sweeping the wavelength of the beam over the entire range of the characterisation:
200 - 2000nm in this study. The measured transmittance is then recorded on a X-Y chart
recorder or converted to a digital form using a suitable A/D converter.
The benefit of having a double beam spectrophotometer means that there is no need for two
separate measurements (one for the uncoated and one for the ITO coated sample) but also the
actual transmittance of the ITO films is obtained directly as a result leaving aside any common
background artifacts such as interference due to the presence of water vapour or indeed
characteristics of the microscope cover slides themselves.
The quantum efficiency, h, of an optoelectronic device is defined as the fraction of electrons
collected over the number of incident photons which are absorbed
[61]; this can be expressed as:
4.5.1 ITO Film Characterisation
4.5.2 Device Quantum Efficiency and Absolute Responsivity